Materials Scientist, Dual Beam Analysis
$115,000–$130,000 year
On-siteMilpitas, California, United States
Job Summary
Join Eurofins EAG Laboratories in the Dual Beam Analysis team to perform FIB/SEM imaging, TEM lamella preparation, SEM/EDS analysis on cross-sections, and data interpretation for semiconductor and materials characterization projects. You will develop and implement automation workflows for lamella preparation, cross-sectioning, and imaging; maintain pipelines for FIB sample preparation, SEM imaging, and data acquisition; and collaborate with cross-functional teams to deliver analytical results. The role involves engaging with a diverse customer base, supporting imaging and analysis across industries, and working a 5pm-2am Tuesday–Saturday shift with ITAR-related compliance.
Required Qualifications
- MS or PhD in Materials Science and Engineering or related field or equivalent industrial experience
- In-depth knowledge of electron microscopy (EM)
- Expert with SEM/EDX, or TEM sample preparation
- Solid understanding of semiconductor device physics and failure analysis
- Excellent communication skills (written, verbal, and presentation)
- Compliance with ITAR and U.S. Persons requirement
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