Applications Engineer- Overlay Metrology (eBeam)
$83,100–$141,300 year
On-siteAustin, Texas, United States
Job Summary
Conduct overlay metrology analysis using eBeam systems to provide high-resolution defect data for semiconductor fabrication. Perform complex data and image analysis with tools like Python, MATLAB, or JMP to identify critical capability gaps in customer technologies. Lead projects from kickoff through completion, delivering clear planning and periodic reporting to internal and external stakeholders. Present findings frequently to customers while collaborating effectively within cross-functional teams. Travel domestically and internationally as needed to support global product delivery and customer engagements.
Required Qualifications
- Expertise in overlay metrology, including eBeam, optical metrology, or both
- Thorough, in-depth understanding of customer technologies, requirements, and critical capability gaps
- Knowledge of optical CD, scatterometry, film metrology, and process characterization
- Excellent customer-facing communication and presentation skills
- Ability to work effectively both independently and in cross-functional teams
- Demonstrated ability to lead projects from kickoff through completion, including clear planning and periodic and final reporting
- Ability to perform complex data and image analysis using data-analysis tools
- Minimum Qualifications Master's or Ph.D. degree in Engineering or Physics, or a related field
Desired Qualifications
- Experience with Python, MATLAB, JMP, SQL, or similar analytical tools is preferred
- Excellent communication, organizational, analytical, and interpersonal skills, with the ability to present results frequently to internal and external customers
- Willingness to travel domestically and internationally
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